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Metacortex
Posts: 14
Registered: ‎11-11-2009
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Why is Deep Inspection listed uner JNCIE-SEC topics?

I am familiar with Deep Inspection on ScreenOS based devices but why is it listed under the exam topics for the JNCIE-SEC while IPS is listed as its own bullet point? This confuses me greatly as I am unable to find any documentation that even mentions Deep Inspection in the Junos space. 

Contributor
Metacortex
Posts: 14
Registered: ‎11-11-2009
0

Re: Why is Deep Inspection listed uner JNCIE-SEC topics?

Bueller?

Juniper Employee
rayado
Posts: 50
Registered: ‎04-26-2010

Re: Why is Deep Inspection listed uner JNCIE-SEC topics?

I think it probably refers to ALG's... I haven't seen ALG's referred to as DPI in SRX specific documentation, but I have in other contexts.

 

 

Juniper Employee
Juniper Employee
Jas
Posts: 6
Registered: ‎08-06-2008
0

Re: Why is Deep Inspection listed uner JNCIE-SEC topics?

You should ignore it and focus on IDP/IPS.

Contributor
Metacortex
Posts: 14
Registered: ‎11-11-2009
0

Re: Why is Deep Inspection listed uner JNCIE-SEC topics?

rayado:

That would make sense. Thank you!

 

Jas:

That was already my plan. I have already been assuming IDS is going to be hit very heavy on the test and have been focusing on that. I just don't want to leave any stone unturned and have nothing on the test I didn't prepare for at least a little bit.  

 

 

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