Why is Deep Inspection listed uner JNCIE-SEC topics?

[Metacortex]

I am familiar with Deep Inspection on ScreenOS based devices but why is it listed under the exam topics for the JNCIE-SEC while IPS is listed as its own bullet point? This confuses me greatly as I am unable to find any documentation that even mentions Deep Inspection in the Junos space. 

[Metacortex]

Bueller?

[rayado · Accepted solution]

I think it probably refers to ALG's... I haven't seen ALG's referred to as DPI in SRX specific documentation, but I have in other contexts.

[Jas]

You should ignore it and focus on IDP/IPS.

[Metacortex]

rayado:

That would make sense. Thank you!

Jas:

That was already my plan. I have already been assuming IDS is going to be hit very heavy on the test and have been focusing on that. I just don't want to leave any stone unturned and have nothing on the test I didn't prepare for at least a little bit.